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1 Ergebnisse
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Dopant Impurity Induced Nanofaceting on Silicon Nanowire Si..:
Li, F
;
Nellist, PD
;
Lang, C
.
Microscopy and Microanalysis. 16 (2010) S2 - p. 1740-1741 , 2010
Link:
https://doi.org/10.1017/s1431927610056266
RT Journal T1 <Title>Dopant Impurity Induced Nanofaceting on Silicon Nanowire Sidewalls</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927610056266&Exemplar=1&LAN=DE A1 Li, F A1 Nellist, PD A1 Lang, C A1 Cockayne, DJH PB Oxford University Press (OUP) YR 2010 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 16 IS S2 SP 1740 OP 1741 LK http://dx.doi.org/https://doi.org/10.1017/s1431927610056266 DO https://doi.org/10.1017/s1431927610056266 SF ELIB - SuUB Bremen
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