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Direct Mapping of Confined Interfacial States in Oxides Usi..:
Shah, AB
;
Zuo, JM
;
Ramasse, QM
...
Microscopy and Microanalysis. 16 (2010) S2 - p. 1394-1395 , 2010
Link:
https://doi.org/10.1017/s143192761005631x
RT Journal T1 <Title>Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s143192761005631x&Exemplar=1&LAN=DE A1 Shah, AB A1 Zuo, JM A1 Ramasse, QM A1 Wen, JG A1 Zhai, X A1 Bhattacharya, A. A1 Eckstein, JN PB Oxford University Press (OUP) YR 2010 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 16 IS S2 SP 1394 OP 1395 LK http://dx.doi.org/https://doi.org/10.1017/s143192761005631x DO https://doi.org/10.1017/s143192761005631x SF ELIB - SuUB Bremen
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