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Methodologies for Quantifying Milling Acuity in Focused Ion..:
Rue, C
;
Young, R
Microscopy and Microanalysis. 16 (2010) S2 - p. 176-177 , 2010
Link:
https://doi.org/10.1017/s1431927610062471
RT Journal T1 <Title>Methodologies for Quantifying Milling Acuity in Focused Ion Beam Systems</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927610062471&Exemplar=1&LAN=DE A1 Rue, C A1 Young, R PB Oxford University Press (OUP) YR 2010 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 16 IS S2 SP 176 OP 177 LK http://dx.doi.org/https://doi.org/10.1017/s1431927610062471 DO https://doi.org/10.1017/s1431927610062471 SF ELIB - SuUB Bremen
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