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1 Ergebnisse
1
Analysis of Local Texture across Layers in Electron-Beam Me..:
Saller, B
;
Porter, JR
;
Van Den Vlekkert, T
.
Microscopy and Microanalysis. 16 (2010) S2 - p. 702-703 , 2010
Link:
https://doi.org/10.1017/s1431927610063191
RT Journal T1
Analysis of Local Texture across Layers in Electron-Beam Melted (EBM) Ti-6Al- 4V via Electron Backscatter Diffraction (EBSD)
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927610063191&Exemplar=1&LAN=DE A1 Saller, B A1 Porter, JR A1 Van Den Vlekkert, T A1 Walck, SD PB Oxford University Press (OUP) YR 2010 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 16 IS S2 SP 702 OP 703 LK http://dx.doi.org/https://doi.org/10.1017/s1431927610063191 DO https://doi.org/10.1017/s1431927610063191 SF ELIB - SuUB Bremen
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