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Grain Boundary Characterization of Nanocrystalline Cu from ..:
Darbal, A
;
Ganesh, K
;
Barmak, K
...
Microscopy and Microanalysis. 17 (2011) S2 - p. 1426-1427 , 2011
Link:
https://doi.org/10.1017/s1431927611008002
RT Journal T1 <Title>Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927611008002&Exemplar=1&LAN=DE A1 Darbal, A A1 Ganesh, K A1 Barmak, K A1 Rohrer, G A1 Ferreira, P A1 Sun, T A1 Coffey, K PB Oxford University Press (OUP) YR 2011 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 17 IS S2 SP 1426 OP 1427 LK http://dx.doi.org/https://doi.org/10.1017/s1431927611008002 DO https://doi.org/10.1017/s1431927611008002 SF ELIB - SuUB Bremen
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