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Scanning Photoemission Spectromicroscopic Study of 4-nm Ult..:
Devan, Rupesh S.
;
Gao, Shun-Yu
;
Lin, Yu-Rong
...
Microscopy and Microanalysis. 17 (2011) 6 - p. 944-949 , 2011
Link:
https://doi.org/10.1017/s1431927611011901
RT Journal T1
Scanning Photoemission Spectromicroscopic Study of 4-nm Ultrathin SiO3.4 Protrusions Probe-Induced on the Native SiO2 Layer
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927611011901&Exemplar=1&LAN=DE A1 Devan, Rupesh S. A1 Gao, Shun-Yu A1 Lin, Yu-Rong A1 Cheng, Shun-Rong A1 Hsu, Chia-Er A1 Chen, Chia-Hao A1 Shiu, Hung-Wei A1 Liou, Yung A1 Ma, Yuan-Ron PB Oxford University Press (OUP) YR 2011 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 17 IS 6 SP 944 OP 949 LK http://dx.doi.org/https://doi.org/10.1017/s1431927611011901 DO https://doi.org/10.1017/s1431927611011901 SF ELIB - SuUB Bremen
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