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Quantitative HAADF-studies of GaP/Si-interfaces:
Haas, B.
;
Beyer, A.
;
Ohlmann, J.
..
Microscopy and Microanalysis. 18 (2012) S2 - p. 352-353 , 2012
Link:
https://doi.org/10.1017/s1431927612003613
RT Journal T1 <Title>Quantitative HAADF-studies of GaP/Si-interfaces</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927612003613&Exemplar=1&LAN=DE A1 Haas, B. A1 Beyer, A. A1 Ohlmann, J. A1 Stolz, W. A1 Volz, K. PB Oxford University Press (OUP) YR 2012 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 18 IS S2 SP 352 OP 353 LK http://dx.doi.org/https://doi.org/10.1017/s1431927612003613 DO https://doi.org/10.1017/s1431927612003613 SF ELIB - SuUB Bremen
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