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Nanopatterning with the Helium Ion Microscope:
Pickard, D.S.
;
Viswanathan, V.
;
Fang, C.
...
Microscopy and Microanalysis. 18 (2012) S2 - p. 800-801 , 2012
Link:
https://doi.org/10.1017/s1431927612005855
RT Journal T1 <Title>Nanopatterning with the Helium Ion Microscope</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927612005855&Exemplar=1&LAN=DE A1 Pickard, D.S. A1 Viswanathan, V. A1 Fang, C. A1 Ai, Z. A1 Hao, H. A1 Wang, Y. A1 Bosman, M. A1 Dorfmüller, J. A1 Giessen, H. PB Oxford University Press (OUP) YR 2012 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 18 IS S2 SP 800 OP 801 LK http://dx.doi.org/https://doi.org/10.1017/s1431927612005855 DO https://doi.org/10.1017/s1431927612005855 SF ELIB - SuUB Bremen
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