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Planar defects in thin films of InGaN:
Liliental-Weber, Z.
;
Yu, K.M.
;
Zakharov, D.
.
Microscopy and Microanalysis. 18 (2012) S2 - p. 1486-1487 , 2012
Link:
https://doi.org/10.1017/s1431927612009282
RT Journal T1 <Title>Planar defects in thin films of InGaN</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927612009282&Exemplar=1&LAN=DE A1 Liliental-Weber, Z. A1 Yu, K.M. A1 Zakharov, D. A1 Bedair, S. PB Oxford University Press (OUP) YR 2012 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 18 IS S2 SP 1486 OP 1487 LK http://dx.doi.org/https://doi.org/10.1017/s1431927612009282 DO https://doi.org/10.1017/s1431927612009282 SF ELIB - SuUB Bremen
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