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Ultra-fast TEM electron diffraction tomography:
Nicolopoulos, S.
;
Gemmi, M.
Microscopy and Microanalysis. 19 (2013) S2 - p. 700-701 , 2013
Link:
https://doi.org/10.1017/s1431927613005497
RT Journal T1 <Title>Ultra-fast TEM electron diffraction tomography</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927613005497&Exemplar=1&LAN=DE A1 Nicolopoulos, S. A1 Gemmi, M. PB Oxford University Press (OUP) YR 2013 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 19 IS S2 SP 700 OP 701 LK http://dx.doi.org/https://doi.org/10.1017/s1431927613005497 DO https://doi.org/10.1017/s1431927613005497 SF ELIB - SuUB Bremen
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