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1 Ergebnisse
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Advanced Characterization of Nanoscale Bridge in Magnetic T..:
Hwang, K.
;
Bae, J.
;
Lee, S.
...
Microscopy and Microanalysis. 19 (2013) S2 - p. 1852-1853 , 2013
Link:
https://doi.org/10.1017/s1431927613011252
RT Journal T1 <Title>Advanced Characterization of Nanoscale Bridge in Magnetic Tunnel Junction by 3-D EDS Tomography</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927613011252&Exemplar=1&LAN=DE A1 Hwang, K. A1 Bae, J. A1 Lee, S. A1 Park, M. A1 Park, K. A1 Choi, J. A1 Ahn, J. A1 Lee, D. A1 Ahn, S. A1 Park, S. A1 Jeong, S. A1 Nam, S. A1 Jeong, G. A1 Cho, H. A1 Jung, E. PB Oxford University Press (OUP) YR 2013 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 19 IS S2 SP 1852 OP 1853 LK http://dx.doi.org/https://doi.org/10.1017/s1431927613011252 DO https://doi.org/10.1017/s1431927613011252 SF ELIB - SuUB Bremen
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