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1 Ergebnisse
1
Resolving 45 pm with 300 kV Aberration Corrected STEM:
Sawada, H.
;
Shimura, N.
;
Satoh, K.
...
Microscopy and Microanalysis. 20 (2014) S3 - p. 124-125 , 2014
Link:
https://doi.org/10.1017/s1431927614002347
RT Journal T1 <Title>Resolving 45 pm with 300 kV Aberration Corrected STEM</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927614002347&Exemplar=1&LAN=DE A1 Sawada, H. A1 Shimura, N. A1 Satoh, K. A1 Okunishi, E. A1 Hosokawa, F. A1 Shibata, N. A1 Ikuhara, Y. PB Oxford University Press (OUP) YR 2014 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 20 IS S3 SP 124 OP 125 LK http://dx.doi.org/https://doi.org/10.1017/s1431927614002347 DO https://doi.org/10.1017/s1431927614002347 SF ELIB - SuUB Bremen
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