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STEM EBIC Mapping of the Metal-Insulator Transition in Thin..:
Hubbard, William A.
;
Joshi, Toyanath
;
Mecklenburg, Matthew
...
Microscopy and Microanalysis. 23 (2017) S1 - p. 1428-1429 , 2017
Link:
https://doi.org/10.1017/s1431927617007802
RT Journal T1
STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927617007802&Exemplar=1&LAN=DE A1 Hubbard, William A. A1 Joshi, Toyanath A1 Mecklenburg, Matthew A1 Zutter, Brian A1 Borisov, Pavel A1 Lederman, David A1 Regan, B. C. PB Oxford University Press (OUP) YR 2017 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 23 IS S1 SP 1428 OP 1429 LK http://dx.doi.org/https://doi.org/10.1017/s1431927617007802 DO https://doi.org/10.1017/s1431927617007802 SF ELIB - SuUB Bremen
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