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1 Ergebnisse
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Assessing Hexagonal Boron Nitride Crystal Quality by Defect..:
Hoffman, T.
;
Zhang, Y.
;
Liu, S.
...
Microscopy and Microanalysis. 23 (2017) S1 - p. 1518-1519 , 2017
Link:
https://doi.org/10.1017/s143192761700825x
RT Journal T1 <Title>Assessing Hexagonal Boron Nitride Crystal Quality by Defect Sensitive Etching</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s143192761700825x&Exemplar=1&LAN=DE A1 Hoffman, T. A1 Zhang, Y. A1 Liu, S. A1 Khan, N. A1 Twigg, M.E. A1 Bassim, N.D. A1 Edgar, J.H. PB Oxford University Press (OUP) YR 2017 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 23 IS S1 SP 1518 OP 1519 LK http://dx.doi.org/https://doi.org/10.1017/s143192761700825x DO https://doi.org/10.1017/s143192761700825x SF ELIB - SuUB Bremen
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