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STEM-EELS Investigation of Charge and Strain Distributions ..:
Li, X.
;
Tied, G.
;
Marinova, M.
...
Microscopy and Microanalysis. 23 (2017) S1 - p. 1610-1611 , 2017
Link:
https://doi.org/10.1017/s1431927617008716
RT Journal T1 <Title>STEM-EELS Investigation of Charge and Strain Distributions in Perovskite Oxide Thin Films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927617008716&Exemplar=1&LAN=DE A1 Li, X. A1 Tied, G. A1 Marinova, M. A1 Preziosi, D. A1 Garcia, V. A1 Fusil, S. A1 Barthelemy, A. A1 Bibes, M. A1 Torres-Pardo, A. A1 Fowlie, J. A1 Gibert, M. A1 Catalano, S. A1 Gariglio, S. A1 Triscone, J.M. A1 Zobelli, A. A1 Tence, M. A1 Bocher, L. A1 Stephan, O. A1 Colliex, C. A1 Gloter, A. PB Oxford University Press (OUP) YR 2017 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 23 IS S1 SP 1610 OP 1611 LK http://dx.doi.org/https://doi.org/10.1017/s1431927617008716 DO https://doi.org/10.1017/s1431927617008716 SF ELIB - SuUB Bremen
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