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Interpretation of meV Resolution Phonon EELS Data:
Batson, P.E.
;
Lagos, M.J.
Microscopy and Microanalysis. 24 (2018) S1 - p. 412-413 , 2018
Link:
https://doi.org/10.1017/s1431927618002556
RT Journal T1 <Title>Interpretation of meV Resolution Phonon EELS Data</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927618002556&Exemplar=1&LAN=DE A1 Batson, P.E. A1 Lagos, M.J. PB Oxford University Press (OUP) YR 2018 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 24 IS S1 SP 412 OP 413 LK http://dx.doi.org/https://doi.org/10.1017/s1431927618002556 DO https://doi.org/10.1017/s1431927618002556 SF ELIB - SuUB Bremen
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