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1 Ergebnisse
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S9000X - Next Generation of Ultra-High Resolution SEM for E..:
Havelka, Miloslav
;
Jiruse, Jaroslav
;
Hrncif, Tomas
...
Microscopy and Microanalysis. 24 (2018) S1 - p. 1116-1117 , 2018
Link:
https://doi.org/10.1017/s1431927618006062
RT Journal T1
S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927618006062&Exemplar=1&LAN=DE A1 Havelka, Miloslav A1 Jiruse, Jaroslav A1 Hrncif, Tomas A1 Jan Polster A1 Vana, Rostislav A1 Zachej, Samuel PB Oxford University Press (OUP) YR 2018 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 24 IS S1 SP 1116 OP 1117 LK http://dx.doi.org/https://doi.org/10.1017/s1431927618006062 DO https://doi.org/10.1017/s1431927618006062 SF ELIB - SuUB Bremen
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