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1 Ergebnisse
1
Exploiting the in-situ Electrical X-ray Microscopy for Semi..:
Tseng, Shao-Chin
;
Lin, Bi-Hsuan
;
Li, Xiao-Yun
...
Microscopy and Microanalysis. 24 (2018) S2 - p. 430-431 , 2018
Link:
https://doi.org/10.1017/s143192761801440x
RT Journal T1
Exploiting the in-situ Electrical X-ray Microscopy for Semiconductor Nano Devices Analysis by X-ray Nanoprobe Beamline at Taiwan Photon Source
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s143192761801440x&Exemplar=1&LAN=DE A1 Tseng, Shao-Chin A1 Lin, Bi-Hsuan A1 Li, Xiao-Yun A1 Lai, Yu-Sheng A1 Tseng, Po-Hsien A1 Lee, Chien-Yu A1 Chen, Bo-Yi A1 Yin, Gung-Chian A1 Hsu, Ming-Ying A1 Chang, Shih-Hung A1 Tang, Mau-Tsu PB Oxford University Press (OUP) YR 2018 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 24 IS S2 SP 430 OP 431 LK http://dx.doi.org/https://doi.org/10.1017/s143192761801440x DO https://doi.org/10.1017/s143192761801440x SF ELIB - SuUB Bremen
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