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BX-1: A New Detector Window for Microanalysis Applications:
Abbott, Jonathan
;
Sommer, Jared
;
Law, Brian
.
Microscopy and Microanalysis. 25 (2019) S2 - p. 518-519 , 2019
Link:
https://doi.org/10.1017/s1431927619003325
RT Journal T1 <Title>BX-1: A New Detector Window for Microanalysis Applications</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927619003325&Exemplar=1&LAN=DE A1 Abbott, Jonathan A1 Sommer, Jared A1 Law, Brian A1 Wong, Josh PB Oxford University Press (OUP) YR 2019 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 25 IS S2 SP 518 OP 519 LK http://dx.doi.org/https://doi.org/10.1017/s1431927619003325 DO https://doi.org/10.1017/s1431927619003325 SF ELIB - SuUB Bremen
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