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1 Ergebnisse
1
Latest Generation of Silicon Drift Detectors and Readout El..:
Pahlke, Andreas
;
Dams, Florian
;
Fojt, Reinhard
...
Microscopy and Microanalysis. 25 (2019) S2 - p. 558-559 , 2019
Link:
https://doi.org/10.1017/s1431927619003520
RT Journal T1
Latest Generation of Silicon Drift Detectors and Readout Electronics
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927619003520&Exemplar=1&LAN=DE A1 Pahlke, Andreas A1 Dams, Florian A1 Fojt, Reinhard A1 Fraczek, Michael A1 Knobloch, Jürgen A1 Luckey, Christian A1 Miyakawa, Natsuki A1 Willems, Niklas PB Oxford University Press (OUP) YR 2019 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 25 IS S2 SP 558 OP 559 LK http://dx.doi.org/https://doi.org/10.1017/s1431927619003520 DO https://doi.org/10.1017/s1431927619003520 SF ELIB - SuUB Bremen
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