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1 Ergebnisse
1
Combine TEM with TCAD Simulation - A Novel Approach in Fail..:
Zhang, Yu
;
Kodali, Satish
;
Banghart, Edmund
..
Microscopy and Microanalysis. 27 (2021) S1 - p. 1548-1549 , 2021
Link:
https://doi.org/10.1017/s1431927621005717
RT Journal T1
Combine TEM with TCAD Simulation - A Novel Approach in Failure Analysis
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927621005717&Exemplar=1&LAN=DE A1 Zhang, Yu A1 Kodali, Satish A1 Banghart, Edmund A1 Mitchell, Travis A1 Baumann, Frieder PB Oxford University Press (OUP) YR 2021 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 27 IS S1 SP 1548 OP 1549 LK http://dx.doi.org/https://doi.org/10.1017/s1431927621005717 DO https://doi.org/10.1017/s1431927621005717 SF ELIB - SuUB Bremen
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