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SEM EDS Mapping of Ultra-Low Energy X-rays Using a Silicon ..:
Mu, Shangshang
;
Rafaelsen, Jens
;
Kawabata, Masanobu
Microscopy and Microanalysis. 28 (2022) S1 - p. 572-573 , 2022
Link:
https://doi.org/10.1017/s1431927622002860
RT Journal T1 <Title>SEM EDS Mapping of Ultra-Low Energy X-rays Using a Silicon Nitride Window Silicon Drift Detector</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927622002860&Exemplar=1&LAN=DE A1 Mu, Shangshang A1 Rafaelsen, Jens A1 Kawabata, Masanobu PB Oxford University Press (OUP) YR 2022 SN 1435-8115 SN 1431-9276 JF Microscopy and Microanalysis VO 28 IS S1 SP 572 OP 573 LK http://dx.doi.org/https://doi.org/10.1017/s1431927622002860 DO https://doi.org/10.1017/s1431927622002860 SF ELIB - SuUB Bremen
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