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Benefits of a Full Field of View in Atom Probe Tomography:
Reinhard, David A
;
Rice, Katherine P
;
Ulfig, Robert M
...
Microscopy and Microanalysis. 28 (2022) S1 - p. 706-708 , 2022
Link:
https://doi.org/10.1017/s1431927622003294
RT Journal T1 <Title>Benefits of a Full Field of View in Atom Probe Tomography</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927622003294&Exemplar=1&LAN=DE A1 Reinhard, David A A1 Rice, Katherine P A1 Ulfig, Robert M A1 Martin, Isabelle A1 Geiser, Brian P A1 Larson, David J PB Oxford University Press (OUP) YR 2022 SN 1435-8115 SN 1431-9276 JF Microscopy and Microanalysis VO 28 IS S1 SP 706 OP 708 LK http://dx.doi.org/https://doi.org/10.1017/s1431927622003294 DO https://doi.org/10.1017/s1431927622003294 SF ELIB - SuUB Bremen
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