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Carbon Capping for Specimen Preparation of Atom Probe Sampl..:
Supple, Edwin
;
Gaspe, Chomani
;
Dwyer, Kevin J
...
Microscopy and Microanalysis. 28 (2022) S1 - p. 744-746 , 2022
Link:
https://doi.org/10.1017/s1431927622003439
RT Journal T1
Carbon Capping for Specimen Preparation of Atom Probe Samples with Features of Interest Near the Surface
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927622003439&Exemplar=1&LAN=DE A1 Supple, Edwin A1 Gaspe, Chomani A1 Dwyer, Kevin J A1 Butera, Robert A1 Richardson, Christopher J K A1 Gorman, Brian PB Oxford University Press (OUP) YR 2022 SN 1435-8115 SN 1431-9276 JF Microscopy and Microanalysis VO 28 IS S1 SP 744 OP 746 LK http://dx.doi.org/https://doi.org/10.1017/s1431927622003439 DO https://doi.org/10.1017/s1431927622003439 SF ELIB - SuUB Bremen
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