I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Electrical performances of AlInN/GaN HEMTs. A comparison wi..:
Jardel, Olivier
;
Callet, Guillaume
;
Dufraisse, Jérémy
...
International Journal of Microwave and Wireless Technologies. 3 (2011) 3 - p. 301-309 , 2011
Link:
https://doi.org/10.1017/s1759078711000419
RT Journal T1
Electrical performances of AlInN/GaN HEMTs. A comparison with AlGaN/GaN HEMTs with similar technological process
UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1759078711000419&Exemplar=1&LAN=DE A1 Jardel, Olivier A1 Callet, Guillaume A1 Dufraisse, Jérémy A1 Piazza, Michele A1 Sarazin, Nicolas A1 Chartier, Eric A1 Oualli, Mourad A1 Aubry, Raphaël A1 Reveyrand, Tibault A1 Jacquet, Jean-Claude A1 Di Forte Poisson, Marie-Antoinette A1 Morvan, Erwan A1 Piotrowicz, Stéphane A1 Delage, Sylvain L. PB Cambridge University Press (CUP) YR 2011 SN 1759-0787 SN 1759-0795 JF International Journal of Microwave and Wireless Technologies VO 3 IS 3 SP 301 OP 309 LK http://dx.doi.org/https://doi.org/10.1017/s1759078711000419 DO https://doi.org/10.1017/s1759078711000419 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)