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1 Ergebnisse
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Atomic Force Microscopy-Scanning Electrochemical Microscopy..:
Leonhardt, Kelly
;
Avdic, Amra
;
Lugstein, Alois
...
Analytical Chemistry. 83 (2011) 8 - p. 2971-2977 , 2011
Link:
https://doi.org/10.1021/ac103083y
RT Journal T1 <Title>Atomic Force Microscopy-Scanning Electrochemical Microscopy: Influence of Tip Geometry and Insulation Defects on Diffusion Controlled Currents at Conical Electrodes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_ac103083y&Exemplar=1&LAN=DE A1 Leonhardt, Kelly A1 Avdic, Amra A1 Lugstein, Alois A1 Pobelov, Ilya A1 Wandlowski, Thomas A1 Wu, Ming A1 Gollas, Bernhard A1 Denuault, Guy PB American Chemical Society (ACS) YR 2011 SN 0003-2700 SN 1520-6882 JF Analytical Chemistry VO 83 IS 8 SP 2971 OP 2977 LK http://dx.doi.org/https://doi.org/10.1021/ac103083y DO https://doi.org/10.1021/ac103083y SF ELIB - SuUB Bremen
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