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1 Ergebnisse
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Correction to Bias Modulated Scanning Ion Conductance Micro..:
McKelvey, Kim
;
Perry, David
;
Byers, Joshua C.
..
Analytical Chemistry. 86 (2014) 9 - p. 4636-4636 , 2014
Link:
https://doi.org/10.1021/ac501224u
RT Journal T1
Correction to Bias Modulated Scanning Ion Conductance Microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_ac501224u&Exemplar=1&LAN=DE A1 McKelvey, Kim A1 Perry, David A1 Byers, Joshua C. A1 Colburn, Alex W. A1 Unwin, Patrick R. PB American Chemical Society (ACS) YR 2014 SN 0003-2700 SN 1520-6882 JF Analytical Chemistry VO 86 IS 9 SP 4636 OP 4636 LK http://dx.doi.org/https://doi.org/10.1021/ac501224u DO https://doi.org/10.1021/ac501224u SF ELIB - SuUB Bremen
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