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Orientation of Few-Layer MoS2 Films: In-Situ X-ray Scatteri..:
Shaji, Ashin
;
Vegso, Karol
;
Sojkova, Michaela
...
The Journal of Physical Chemistry C. 125 (2021) 17 - p. 9461-9468 , 2021
Link:
https://doi.org/10.1021/acs.jpcc.1c01716
RT Journal T1 <Title>Orientation of Few-Layer MoS2 Films: In-Situ X-ray Scattering Study During Sulfurization</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acs.jpcc.1c01716&Exemplar=1&LAN=DE A1 Shaji, Ashin A1 Vegso, Karol A1 Sojkova, Michaela A1 Hulman, Martin A1 Nadazdy, Peter A1 Hutar, Peter A1 Pribusova Slusna, Lenka A1 Hrda, Jana A1 Bodik, Michal A1 Hodas, Martin A1 Bernstorff, Sigrid A1 Jergel, Matej A1 Majkova, Eva A1 Schreiber, Frank A1 Siffalovic, Peter PB American Chemical Society (ACS) YR 2021 SN 1932-7447 SN 1932-7455 JF The Journal of Physical Chemistry C VO 125 IS 17 SP 9461 OP 9468 LK http://dx.doi.org/https://doi.org/10.1021/acs.jpcc.1c01716 DO https://doi.org/10.1021/acs.jpcc.1c01716 SF ELIB - SuUB Bremen
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