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1 Ergebnisse
1
Thickness Dependence of Carrier Mobility and the Interface ..:
Xu, Hui
;
Zhai, Wen-Juan
;
Tang, Chao
...
The Journal of Physical Chemistry C. 120 (2016) 31 - p. 17184-17189 , 2016
Link:
https://doi.org/10.1021/acs.jpcc.6b03964
RT Journal T1 <Title>Thickness Dependence of Carrier Mobility and the Interface Trap Free Energy Investigated by Impedance Spectroscopy in Organic Semiconductors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acs.jpcc.6b03964&Exemplar=1&LAN=DE A1 Xu, Hui A1 Zhai, Wen-Juan A1 Tang, Chao A1 Qiu, Shao-Ya A1 Liu, Rui-Lan A1 Rong, Zhou A1 Pang, Zong-Qiang A1 Jiang, Bing A1 Xiao, Jing A1 Zhong, Chao A1 Mi, Bao-Xiu A1 Fan, Qu-Li A1 Huang, Wei PB American Chemical Society (ACS) YR 2016 SN 1932-7447 SN 1932-7455 JF The Journal of Physical Chemistry C VO 120 IS 31 SP 17184 OP 17189 LK http://dx.doi.org/https://doi.org/10.1021/acs.jpcc.6b03964 DO https://doi.org/10.1021/acs.jpcc.6b03964 SF ELIB - SuUB Bremen
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