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Enhanced Depth Profiling of Perovskite Oxide: Low Defect Le..:
Ridier, Karl
;
Aureau, Damien
;
Bérini, Bruno
...
The Journal of Physical Chemistry C. 120 (2016) 38 - p. 21358-21363 , 2016
Link:
https://doi.org/10.1021/acs.jpcc.6b04007
RT Journal T1 <Title>Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO3 by Argon Cluster Sputtering</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acs.jpcc.6b04007&Exemplar=1&LAN=DE A1 Ridier, Karl A1 Aureau, Damien A1 Bérini, Bruno A1 Dumont, Yves A1 Keller, Niels A1 Vigneron, Jackie A1 Etcheberry, Arnaud A1 Fouchet, Arnaud PB American Chemical Society (ACS) YR 2016 SN 1932-7447 SN 1932-7455 JF The Journal of Physical Chemistry C VO 120 IS 38 SP 21358 OP 21363 LK http://dx.doi.org/https://doi.org/10.1021/acs.jpcc.6b04007 DO https://doi.org/10.1021/acs.jpcc.6b04007 SF ELIB - SuUB Bremen
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