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Mechanism of the Key Impact of Residual Carbon Content on t..:
Niu, Gang
;
Cartoixà, Xavier
;
Grossi, Alessandro
...
The Journal of Physical Chemistry C. 121 (2017) 12 - p. 7005-7014 , 2017
Link:
https://doi.org/10.1021/acs.jpcc.6b12771
RT Journal T1
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acs.jpcc.6b12771&Exemplar=1&LAN=DE A1 Niu, Gang A1 Cartoixà, Xavier A1 Grossi, Alessandro A1 Zambelli, Cristian A1 Olivo, Piero A1 Perez, Eduardo A1 Schubert, Markus Andreas A1 Zaumseil, Peter A1 Costina, Ioan A1 Schroeder, Thomas A1 Wenger, Christian PB American Chemical Society (ACS) YR 2017 SN 1932-7447 SN 1932-7455 JF The Journal of Physical Chemistry C VO 121 IS 12 SP 7005 OP 7014 LK http://dx.doi.org/https://doi.org/10.1021/acs.jpcc.6b12771 DO https://doi.org/10.1021/acs.jpcc.6b12771 SF ELIB - SuUB Bremen
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