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Composition Metrology of Ternary Semiconductor Alloys Analy..:

Di Russo, E. ; Moyon, F. ; Gogneau, N....
The Journal of Physical Chemistry C.  122 (2018)  29 - p. 16704-16714 , 2018
Link: https://doi.org/10.1021/acs.jpcc.8b03223