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Determining the Dielectric Tensor of Microtextured Organic ..:
Funke, Sebastian
;
Duwe, Matthias
;
Balzer, Frank
...
The Journal of Physical Chemistry Letters. 12 (2021) 12 - p. 3053-3058 , 2021
Link:
https://doi.org/10.1021/acs.jpclett.1c00317
RT Journal T1 <Title>Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acs.jpclett.1c00317&Exemplar=1&LAN=DE A1 Funke, Sebastian A1 Duwe, Matthias A1 Balzer, Frank A1 Thiesen, Peter H. A1 Hingerl, Kurt A1 Schiek, Manuela PB American Chemical Society (ACS) YR 2021 SN 1948-7185 SN 1948-7185 JF The Journal of Physical Chemistry Letters VO 12 IS 12 SP 3053 OP 3058 LK http://dx.doi.org/https://doi.org/10.1021/acs.jpclett.1c00317 DO https://doi.org/10.1021/acs.jpclett.1c00317 SF ELIB - SuUB Bremen
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