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1 Ergebnisse
1
Effective Suppression of MIS Interface Defects Using Boron ..:
Li, Xiao-Xi
;
Sun, Yu
;
Zeng, Guang
...
The Journal of Physical Chemistry Letters. 13 (2022) 15 - p. 3377-3381 , 2022
Link:
https://doi.org/10.1021/acs.jpclett.2c00722
RT Journal T1 <Title>Effective Suppression of MIS Interface Defects Using Boron Nitride toward High-Performance Ta-Doped-β-Ga2O3 MISFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acs.jpclett.2c00722&Exemplar=1&LAN=DE A1 Li, Xiao-Xi A1 Sun, Yu A1 Zeng, Guang A1 Li, Yu-Chun A1 Zhang, Rui A1 Sai, Qing-Lin A1 Xia, Chang-Tai A1 Zhang, David Wei A1 Yang, Ying-Guo A1 Lu, Hong-Liang PB American Chemical Society (ACS) YR 2022 SN 1948-7185 SN 1948-7185 JF The Journal of Physical Chemistry Letters VO 13 IS 15 SP 3377 OP 3381 LK http://dx.doi.org/https://doi.org/10.1021/acs.jpclett.2c00722 DO https://doi.org/10.1021/acs.jpclett.2c00722 SF ELIB - SuUB Bremen
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