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Trap-Induced Long-Lived Internal Charge Separation in Sn-Do..:

Cheng, Hui ; Sun, Fengke ; Yan, Xianchang...
The Journal of Physical Chemistry Letters.  15 (2024)  18 - p. 4792-4798 , 2024
Link: https://doi.org/10.1021/acs.jpclett.4c00862