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Self-Pixelation Through Fracture in VO2 Thin Films:
Rodríguez, Laura
;
del Corro, Elena
;
Conroy, Michele
...
ACS Applied Electronic Materials. 2 (2020) 5 - p. 1433-1439 , 2020
Link:
https://doi.org/10.1021/acsaelm.0c00199
RT Journal T1
Self-Pixelation Through Fracture in VO2 Thin Films
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsaelm.0c00199&Exemplar=1&LAN=DE A1 Rodríguez, Laura A1 del Corro, Elena A1 Conroy, Michele A1 Moore, Kalani A1 Sandiumenge, Felip A1 Domingo, Neus A1 Santiso, José A1 Catalan, Gustau PB American Chemical Society (ACS) YR 2020 SN 2637-6113 SN 2637-6113 JF ACS Applied Electronic Materials VO 2 IS 5 SP 1433 OP 1439 LK http://dx.doi.org/https://doi.org/10.1021/acsaelm.0c00199 DO https://doi.org/10.1021/acsaelm.0c00199 SF ELIB - SuUB Bremen
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