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Oxygen Defect Stability in Amorphous, C-Axis Aligned, and S..:
van Setten, Michiel J.
;
Dekkers, Harold F. W.
;
Kljucar, Luka
...
ACS Applied Electronic Materials. 3 (2021) 9 - p. 4037-4046 , 2021
Link:
https://doi.org/10.1021/acsaelm.1c00553
RT Journal T1
Oxygen Defect Stability in Amorphous, C-Axis Aligned, and Spinel IGZO
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsaelm.1c00553&Exemplar=1&LAN=DE A1 van Setten, Michiel J. A1 Dekkers, Harold F. W. A1 Kljucar, Luka A1 Mitard, Jerome A1 Pashartis, Christopher A1 Subhechha, Subhali A1 Rassoul, Nouredine A1 Delhougne, Romain A1 Kar, Gouri S. A1 Pourtois, Geoffrey PB American Chemical Society (ACS) YR 2021 SN 2637-6113 SN 2637-6113 JF ACS Applied Electronic Materials VO 3 IS 9 SP 4037 OP 4046 LK http://dx.doi.org/https://doi.org/10.1021/acsaelm.1c00553 DO https://doi.org/10.1021/acsaelm.1c00553 SF ELIB - SuUB Bremen
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