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1 Ergebnisse
1
Effect of Excess Carriers on the Degradation of InP-Based Q..:
Kim, Kyunghwan
;
Hahm, Donghyo
;
Baek, Geun Woo
...
ACS Applied Electronic Materials. 4 (2022) 12 - p. 6229-6236 , 2022
Link:
https://doi.org/10.1021/acsaelm.2c01351
RT Journal T1
Effect of Excess Carriers on the Degradation of InP-Based Quantum-Dot Light-Emitting Diodes
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsaelm.2c01351&Exemplar=1&LAN=DE A1 Kim, Kyunghwan A1 Hahm, Donghyo A1 Baek, Geun Woo A1 Lee, Taesoo A1 Shin, Doyoon A1 Lim, Jaemin A1 Bae, Wan Ki A1 Kwak, Jeonghun PB American Chemical Society (ACS) YR 2022 SN 2637-6113 SN 2637-6113 JF ACS Applied Electronic Materials VO 4 IS 12 SP 6229 OP 6236 LK http://dx.doi.org/https://doi.org/10.1021/acsaelm.2c01351 DO https://doi.org/10.1021/acsaelm.2c01351 SF ELIB - SuUB Bremen
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