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1 Ergebnisse
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Microscopic Analysis of Interdiffusion and Void Formation i..:
Baines, Tom
;
Bowen, Leon
;
Mendis, Budhika G.
.
ACS Applied Materials & Interfaces. 12 (2020) 34 - p. 38070-38075 , 2020
Link:
https://doi.org/10.1021/acsami.0c09381
RT Journal T1 <Title>Microscopic Analysis of Interdiffusion and Void Formation in CdTe(1–x)Sexand CdTe Layers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.0c09381&Exemplar=1&LAN=DE A1 Baines, Tom A1 Bowen, Leon A1 Mendis, Budhika G. A1 Major, Jonathan D. PB American Chemical Society (ACS) YR 2020 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 12 IS 34 SP 38070 OP 38075 LK http://dx.doi.org/https://doi.org/10.1021/acsami.0c09381 DO https://doi.org/10.1021/acsami.0c09381 SF ELIB - SuUB Bremen
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