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1 Ergebnisse
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Transient Evolution of the Built-in Field at Junctions of G..:
Chen, Xihan
;
Pekarek, Ryan T.
;
Gu, Jing
...
ACS Applied Materials & Interfaces. 12 (2020) 36 - p. 40339-40346 , 2020
Link:
https://doi.org/10.1021/acsami.0c11474
RT Journal T1 <Title>Transient Evolution of the Built-in Field at Junctions of GaAs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.0c11474&Exemplar=1&LAN=DE A1 Chen, Xihan A1 Pekarek, Ryan T. A1 Gu, Jing A1 Zakutayev, Andriy A1 Hurst, Katherine E. A1 Neale, Nathan R. A1 Yang, Ye A1 Beard, Matthew C. PB American Chemical Society (ACS) YR 2020 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 12 IS 36 SP 40339 OP 40346 LK http://dx.doi.org/https://doi.org/10.1021/acsami.0c11474 DO https://doi.org/10.1021/acsami.0c11474 SF ELIB - SuUB Bremen
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