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1 Ergebnisse
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On the Correlation between Light-Induced Degradation and Mi..:
Jafari, Saman
;
Zhu, Yan
;
Rougieux, Fiacre
...
ACS Applied Materials & Interfaces. 13 (2021) 5 - p. 6140-6146 , 2021
Link:
https://doi.org/10.1021/acsami.0c17549
RT Journal T1 <Title>On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.0c17549&Exemplar=1&LAN=DE A1 Jafari, Saman A1 Zhu, Yan A1 Rougieux, Fiacre A1 De Guzman, Joyce Ann T. A1 Markevich, Vladimir P. A1 Peaker, Anthony R. A1 Hameiri, Ziv PB American Chemical Society (ACS) YR 2021 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 13 IS 5 SP 6140 OP 6146 LK http://dx.doi.org/https://doi.org/10.1021/acsami.0c17549 DO https://doi.org/10.1021/acsami.0c17549 SF ELIB - SuUB Bremen
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