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Charge Trapping in Amorphous Dielectrics for Secure Charge ..:
Baik, Seung Jae
;
Shin, Hyunjung
ACS Applied Materials & Interfaces. 13 (2021) 9 - p. 11507-11514 , 2021
Link:
https://doi.org/10.1021/acsami.0c23083
RT Journal T1 <Title>Charge Trapping in Amorphous Dielectrics for Secure Charge Storage</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.0c23083&Exemplar=1&LAN=DE A1 Baik, Seung Jae A1 Shin, Hyunjung PB American Chemical Society (ACS) YR 2021 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 13 IS 9 SP 11507 OP 11514 LK http://dx.doi.org/https://doi.org/10.1021/acsami.0c23083 DO https://doi.org/10.1021/acsami.0c23083 SF ELIB - SuUB Bremen
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