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1 Ergebnisse
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Unveiling the Origin of Robust Ferroelectricity in Sub-2 nm..:
Lee, Hyangsook
;
Choe, Duk-Hyun
;
Jo, Sanghyun
...
ACS Applied Materials & Interfaces. 13 (2021) 30 - p. 36499-36506 , 2021
Link:
https://doi.org/10.1021/acsami.1c08718
RT Journal T1 <Title>Unveiling the Origin of Robust Ferroelectricity in Sub-2 nm Hafnium Zirconium Oxide Films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.1c08718&Exemplar=1&LAN=DE A1 Lee, Hyangsook A1 Choe, Duk-Hyun A1 Jo, Sanghyun A1 Kim, Jung-Hwa A1 Lee, Hyun Hwi A1 Shin, Hyun-Joon A1 Park, Yeehyun A1 Kang, Seunghun A1 Cho, Yeonchoo A1 Park, Seontae A1 Moon, Taehwan A1 Eom, Deokjoon A1 Leem, Mirine A1 Kim, Yunseok A1 Heo, Jinseong A1 Lee, Eunha A1 Kim, Hyoungsub PB American Chemical Society (ACS) YR 2021 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 13 IS 30 SP 36499 OP 36506 LK http://dx.doi.org/https://doi.org/10.1021/acsami.1c08718 DO https://doi.org/10.1021/acsami.1c08718 SF ELIB - SuUB Bremen
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