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Analysis of Interface Phenomena for High-Performance Dual-S..:
Im, Changik
;
Kim, Jiyeon
;
Cho, Nam-Kwang
...
ACS Applied Materials & Interfaces. 13 (2021) 43 - p. 51266-51278 , 2021
Link:
https://doi.org/10.1021/acsami.1c17351
RT Journal T1 <Title>Analysis of Interface Phenomena for High-Performance Dual-Stacked Oxide Thin-Film Transistors via Equivalent Circuit Modeling</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.1c17351&Exemplar=1&LAN=DE A1 Im, Changik A1 Kim, Jiyeon A1 Cho, Nam-Kwang A1 Park, Jintaek A1 Lee, Eun Goo A1 Lee, Sung-Eun A1 Na, Hyun-Jae A1 Gong, Yong Jun A1 Kim, Youn Sang PB American Chemical Society (ACS) YR 2021 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 13 IS 43 SP 51266 OP 51278 LK http://dx.doi.org/https://doi.org/10.1021/acsami.1c17351 DO https://doi.org/10.1021/acsami.1c17351 SF ELIB - SuUB Bremen
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