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1 Ergebnisse
1
Fluorination-Induced Charge Trapping and Operational Instab..:
Lee, Hansol
;
Moon, Byungho
;
Kim, Min-Jae
...
ACS Applied Materials & Interfaces. 14 (2022) 34 - p. 39098-39108 , 2022
Link:
https://doi.org/10.1021/acsami.2c04643
RT Journal T1
Fluorination-Induced Charge Trapping and Operational Instability in Conjugated-Polymer Field-Effect Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.2c04643&Exemplar=1&LAN=DE A1 Lee, Hansol A1 Moon, Byungho A1 Kim, Min-Jae A1 Kim, Hee Su A1 Hwang, Do-Hoon A1 Kang, Boseok A1 Cho, Kilwon PB American Chemical Society (ACS) YR 2022 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 14 IS 34 SP 39098 OP 39108 LK http://dx.doi.org/https://doi.org/10.1021/acsami.2c04643 DO https://doi.org/10.1021/acsami.2c04643 SF ELIB - SuUB Bremen
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