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1 Ergebnisse
1
Interface Investigation on SiGe/Si Multilayer Structures: I..:
Kong, Zhenzhen
;
Song, Yanpeng
;
Wang, Hailing
...
ACS Applied Materials & Interfaces. 15 (2023) 48 - p. 56567-56574 , 2023
Link:
https://doi.org/10.1021/acsami.3c14168
RT Journal T1
Interface Investigation on SiGe/Si Multilayer Structures: Influence of Different Epitaxial Process Conditions
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.3c14168&Exemplar=1&LAN=DE A1 Kong, Zhenzhen A1 Song, Yanpeng A1 Wang, Hailing A1 Liu, Xiaomeng A1 Wang, Xiangsheng A1 Liu, Jinbiao A1 Li, Ben A1 Su, Jiale A1 Tan, Xinguang A1 Luan, Qingjie A1 Lin, Hongxiao A1 Ren, Yuhui A1 Zhang, Yiwen A1 Liu, Jingxiong A1 Li, Junfeng A1 Du, Anyan A1 Radamson, Henry H. A1 Zhao, Chao A1 Ye, Tianchun A1 Wang, Guilei PB American Chemical Society (ACS) YR 2023 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 15 IS 48 SP 56567 OP 56574 LK http://dx.doi.org/https://doi.org/10.1021/acsami.3c14168 DO https://doi.org/10.1021/acsami.3c14168 SF ELIB - SuUB Bremen
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