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1 Ergebnisse
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Electrically Triggered Domain Wall Movement in Cu2Se Semico..:
Dong, Ruifeng
;
Wang, Zhengzhou
;
Bai, Hui
...
ACS Applied Materials & Interfaces. 16 (2024) 12 - p. 15525-15532 , 2024
Link:
https://doi.org/10.1021/acsami.3c18806
RT Journal T1 <Title>Electrically Triggered Domain Wall Movement in Cu2Se Semiconductor</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.3c18806&Exemplar=1&LAN=DE A1 Dong, Ruifeng A1 Wang, Zhengzhou A1 Bai, Hui A1 Xie, Chenghao A1 Tan, Gangjian A1 Zhang, Qingjie A1 Wu, Jinsong PB American Chemical Society (ACS) YR 2024 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 16 IS 12 SP 15525 OP 15532 LK http://dx.doi.org/https://doi.org/10.1021/acsami.3c18806 DO https://doi.org/10.1021/acsami.3c18806 SF ELIB - SuUB Bremen
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