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1 Ergebnisse
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Enhanced Electrical Properties and Stability in IGZO TFTs v..:
Kim, Min Seong
;
Kim, Hyung Tae
;
Jung, Sujin
...
ACS Applied Materials & Interfaces. 16 (2024) 31 - p. 41127-41133 , 2024
Link:
https://doi.org/10.1021/acsami.4c06708
RT Journal T1 <Title>Enhanced Electrical Properties and Stability in IGZO TFTs via Low-Temperature Activation with MgOx Layer</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.4c06708&Exemplar=1&LAN=DE A1 Kim, Min Seong A1 Kim, Hyung Tae A1 Jung, Sujin A1 Kim, Young Wook A1 Lee, Sujin A1 Kim, Hyun Jae PB American Chemical Society (ACS) YR 2024 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 16 IS 31 SP 41127 OP 41133 LK http://dx.doi.org/https://doi.org/10.1021/acsami.4c06708 DO https://doi.org/10.1021/acsami.4c06708 SF ELIB - SuUB Bremen
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