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1 Ergebnisse
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Atomic Layer Growth of Rutile TiO2 Films with Ultrahigh Die..:
Kim, Taikyu
;
Jeon, Jihoon
;
Ryu, Seung Ho
...
ACS Applied Materials & Interfaces. 16 (2024) 26 - p. 33877-33884 , 2024
Link:
https://doi.org/10.1021/acsami.4c08379
RT Journal T1 <Title>Atomic Layer Growth of Rutile TiO2 Films with Ultrahigh Dielectric Constants via Crystal Orientation Engineering</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.4c08379&Exemplar=1&LAN=DE A1 Kim, Taikyu A1 Jeon, Jihoon A1 Ryu, Seung Ho A1 Chung, Hong Keun A1 Jang, Myoungsu A1 Lee, Seunghyeok A1 Chung, Yoon Jang A1 Kim, Seong Keun PB American Chemical Society (ACS) YR 2024 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 16 IS 26 SP 33877 OP 33884 LK http://dx.doi.org/https://doi.org/10.1021/acsami.4c08379 DO https://doi.org/10.1021/acsami.4c08379 SF ELIB - SuUB Bremen
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