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1 Ergebnisse
1
Highly Reliable Top-Gated Thin-Film Transistor Memory with ..:
Wang, Wei
;
Hwang, Sun Kak
;
Kim, Kang Lib
...
ACS Applied Materials & Interfaces. 7 (2015) 20 - p. 10957-10965 , 2015
Link:
https://doi.org/10.1021/acsami.5b02213
RT Journal T1 <Title>Highly Reliable Top-Gated Thin-Film Transistor Memory with Semiconducting, Tunneling, Charge-Trapping, and Blocking Layers All of Flexible Polymers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.5b02213&Exemplar=1&LAN=DE A1 Wang, Wei A1 Hwang, Sun Kak A1 Kim, Kang Lib A1 Lee, Ju Han A1 Cho, Suk Man A1 Park, Cheolmin PB American Chemical Society (ACS) YR 2015 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 7 IS 20 SP 10957 OP 10965 LK http://dx.doi.org/https://doi.org/10.1021/acsami.5b02213 DO https://doi.org/10.1021/acsami.5b02213 SF ELIB - SuUB Bremen
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